<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-F8GCH509</identifier><date>2015</date><creator>Govindaraj, T.</creator><creator>Kavitha, M.</creator><relation>documents/doc/F/URN_NBN_SI_doc-F8GCH509_001.pdf</relation><relation>documents/doc/F/URN_NBN_SI_doc-F8GCH509_001.txt</relation><format format_type="issue">1</format><format format_type="volume">45</format><format format_type="type">article</format><format format_type="extent">str. 66-72</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">280571136</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-F8GCH509</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">baterije</subject><subject language_type_id="slv">CMOS</subject><subject language_type_id="slv">integrirana vezja</subject><subject language_type_id="slv">mikroelektronika</subject><title>Low leakage charge recycling power gating structure for CMOS VLSI circuits</title><title>Vezja CMOS VLSI z nizkim uhajalnim tokom vrat</title></Record>