<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-BXNHBN1W</identifier><date>2015</date><creator>Kuo, Chil-Chyuan</creator><relation>documents/doc/B/URN_NBN_SI_doc-BXNHBN1W_001.pdf</relation><relation>documents/doc/B/URN_NBN_SI_doc-BXNHBN1W_001.txt</relation><format format_type="volume">49</format><format format_type="issue">5</format><format format_type="type">article</format><format format_type="extent">str. 687-691</format><identifier identifier_type="ISSN">1580-2949</identifier><identifier identifier_type="COBISSID">282302720</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-BXNHBN1W</identifier><language>eng</language><publisher>Inštitut za kovinske materiale in tehnologije</publisher><source>Materiali in tehnologije</source><rights>InC</rights><subject language_type_id="slv">silicij</subject><subject language_type_id="slv">tanke plasti</subject><subject language_type_id="slv">UV-laserska kristalizacija</subject><subject language_type_id="slv">velikost zrn</subject><title>A reliable approach to a rapid calculation of the grain size of polycrystalline thin films after excimer laser crystalization</title><title>Zanesljiv način hitrega izračuna velikosti zrn v polikristalni tanki plasti po UV-laserski kristalizaciji</title></Record>