<?xml version="1.0"?><rdf:RDF xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:edm="http://www.europeana.eu/schemas/edm/" xmlns:wgs84_pos="http://www.w3.org/2003/01/geo/wgs84_pos" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:rdaGr2="http://rdvocab.info/ElementsGr2" xmlns:oai="http://www.openarchives.org/OAI/2.0/" xmlns:owl="http://www.w3.org/2002/07/owl#" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:ore="http://www.openarchives.org/ore/terms/" xmlns:skos="http://www.w3.org/2004/02/skos/core#" xmlns:dcterms="http://purl.org/dc/terms/"><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-AW7IJQBR/9c83d760-f1d2-4d42-a05c-cf73efdc2a2e/PDF"><dcterms:extent>984 KB</dcterms:extent></edm:WebResource><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-AW7IJQBR/e25d3f10-f05a-4802-bd3a-cb14d7f00d19/TEXT"><dcterms:extent>34 KB</dcterms:extent></edm:WebResource><edm:TimeSpan rdf:about="1985-2025"><edm:begin xml:lang="en">1985</edm:begin><edm:end xml:lang="en">2025</edm:end></edm:TimeSpan><edm:ProvidedCHO rdf:about="URN:NBN:SI:DOC-AW7IJQBR"><dcterms:isPartOf rdf:resource="https://www.dlib.si/details/URN:NBN:SI:spr-Z2J12Z6C" /><dcterms:issued>1998</dcterms:issued><dc:creator>Kralj, Samo</dc:creator><dc:creator>Petkovšek, Rok</dc:creator><dc:creator>Pirš, Janez</dc:creator><dc:creator>Pirš, Silvija</dc:creator><dc:creator>Žumer, Slobodan</dc:creator><dc:format xml:lang="sl">številka:1</dc:format><dc:format xml:lang="sl">letnik:28</dc:format><dc:format xml:lang="sl">str. 25-32</dc:format><dc:identifier>ISSN:0352-9045</dc:identifier><dc:identifier>COBISSID:7960840</dc:identifier><dc:identifier>URN:URN:NBN:SI:doc-AW7IJQBR</dc:identifier><dc:language>en</dc:language><dc:publisher xml:lang="sl">Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</dc:publisher><dcterms:isPartOf xml:lang="sl">Informacije MIDEM</dcterms:isPartOf><dc:subject xml:lang="sl">lastnosti</dc:subject><dc:subject xml:lang="sl">samarijev karbid</dc:subject><dc:subject xml:lang="sl">ševronska struktura</dc:subject><dc:subject xml:lang="sl">tekoči kristali</dc:subject><dcterms:temporal rdf:resource="1985-2025" /><dc:title xml:lang="sl">Influence of surface topografy! on zig-zag defects in ferroelectric liquid crystal displays| Vpliv površinskih pogojev na strukturo zig-zag defektov v feroelektričnih LCD prikazalnikih|</dc:title><dc:description xml:lang="sl">The influence of surface conditions on chevron structures and zig-zag defects in a SmC liquid crystall cell is studied both experimentally and theoretically. In order to gain insight into basic properties of the system the Landau-Ginzburg type theory is used in terms of the nematic director field and the smectic complex order parameter. On a simple model system transitions in the C1 and C2 chevron structures are studied as functions of the surface pretilt angle. The threshold conditions are calculated. The width of the straight element of the domain wall (running parallel to smectic layers) and the costs for its formation are estimated. In the experimental part of the work the effect of the confining substrate with controlled variation of the surface slope on the formation of zig-zag defects is analysed. Observed results are in line with theoretical expectations</dc:description><dc:description xml:lang="sl">Preučevali smo vpliv površinskih pogojev na strukturo ševronov in zig-zag efektov v SmC tekočem kristalu, omenjenem v planparalelni celici. Kvalitativno obnašanje sistema smo ocenili izhajajoč iz Lindau-Ginzburgove proste energije, izražene z nematičnim direktorskim poljem in smektičnim kompleksnim ureditvenim parametrom. Na poenostavljenem modelu smo proučevali prehode med ševronskima strukturama C1 i C2 v odvisnosti od nagiba molekul ob površini celice. Izračunali smo kritični pogoj prehoda. Ocenili smo širino in potrebno energijo za tvorbo domenske stene med področjima različne orientacije ševrona. V eksperimentalnem delu smo preučevali vpliv površine s kontrolirano variacijo površinskega nagiba na nastanek zig-zag defektov. Opaženi rezultati se kvalitativno ujemajo s teoretičnimi napovedmi</dc:description><edm:type>TEXT</edm:type><dc:type xml:lang="sl">znanstveno časopisje</dc:type><dc:type xml:lang="en">journals</dc:type><dc:type rdf:resource="http://www.wikidata.org/entity/Q361785" /></edm:ProvidedCHO><ore:Aggregation rdf:about="http://www.dlib.si/?URN=URN:NBN:SI:DOC-AW7IJQBR"><edm:aggregatedCHO rdf:resource="URN:NBN:SI:DOC-AW7IJQBR" /><edm:isShownBy rdf:resource="http://www.dlib.si/stream/URN:NBN:SI:DOC-AW7IJQBR/9c83d760-f1d2-4d42-a05c-cf73efdc2a2e/PDF" /><edm:rights rdf:resource="http://rightsstatements.org/vocab/InC/1.0/" /><edm:provider>Slovenian National E-content Aggregator</edm:provider><edm:intermediateProvider xml:lang="en">National and University Library of Slovenia</edm:intermediateProvider><edm:dataProvider xml:lang="sl">Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</edm:dataProvider><edm:object rdf:resource="http://www.dlib.si/streamdb/URN:NBN:SI:DOC-AW7IJQBR/maxi/edm" /><edm:isShownAt rdf:resource="http://www.dlib.si/details/URN:NBN:SI:DOC-AW7IJQBR" /></ore:Aggregation></rdf:RDF>