<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-AT1GDQ7B</identifier><date>2019</date><creator>Kristan, Matej</creator><creator>Lukežič, Alan</creator><creator>Žust, Lojze</creator><relation>documents/doc/A/URN_NBN_SI_doc-AT1GDQ7B_001.pdf</relation><relation>documents/doc/A/URN_NBN_SI_doc-AT1GDQ7B_001.txt</relation><format format_type="type">article</format><format format_type="extent">Str. 252-255</format><identifier identifier_type="COBISSID_HOST">1538369987</identifier><identifier identifier_type="ISSN">2591-0442</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-AT1GDQ7B</identifier><language>slv</language><publisher publisher_location="Ljubljana">Društvo Slovenska sekcija IEEE</publisher><source>Zbornik mednarodne Elektrotehniške in računalniške konference</source><rights>InC</rights><subject language_type_id="eng">deflectometry</subject><subject language_type_id="slv">deflektometrija</subject><subject language_type_id="eng">detection</subject><subject language_type_id="slv">detekcija</subject><title>Semantična segmentacija za detekcijo kompaktnih površinskih anomalij z deflektometrijo</title></Record>