<?xml version="1.0"?><rdf:RDF xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:edm="http://www.europeana.eu/schemas/edm/" xmlns:wgs84_pos="http://www.w3.org/2003/01/geo/wgs84_pos" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:rdaGr2="http://rdvocab.info/ElementsGr2" xmlns:oai="http://www.openarchives.org/OAI/2.0/" xmlns:owl="http://www.w3.org/2002/07/owl#" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:ore="http://www.openarchives.org/ore/terms/" xmlns:skos="http://www.w3.org/2004/02/skos/core#" xmlns:dcterms="http://purl.org/dc/terms/"><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-AF8XFN7W/0beb852f-03eb-458a-8b67-bc575ab91a69/PDF"><dcterms:extent>251 KB</dcterms:extent></edm:WebResource><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-AF8XFN7W/3df63780-ee89-4403-98a4-ced3c9889d73/TEXT"><dcterms:extent>13 KB</dcterms:extent></edm:WebResource><edm:TimeSpan rdf:about="1985-2025"><edm:begin xml:lang="en">1985</edm:begin><edm:end xml:lang="en">2025</edm:end></edm:TimeSpan><edm:ProvidedCHO rdf:about="URN:NBN:SI:DOC-AF8XFN7W"><dcterms:isPartOf rdf:resource="https://www.dlib.si/details/URN:NBN:SI:spr-Z2J12Z6C" /><dcterms:issued>1992</dcterms:issued><dc:format xml:lang="sl">22 (1992), 2 ; str. 107-111</dc:format><dc:identifier>ISSN:0352-9045</dc:identifier><dc:identifier>COBISSID_HOST:3971844</dc:identifier><dc:identifier>URN:URN:NBN:SI:doc-AF8XFN7W</dc:identifier><dc:language>sl</dc:language><dc:publisher xml:lang="sl">Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</dc:publisher><dcterms:isPartOf xml:lang="sl">Informacije MIDEM</dcterms:isPartOf><dc:subject xml:lang="en">electrical measurements</dc:subject><dc:subject xml:lang="sl">električne meritve</dc:subject><dc:subject xml:lang="en">measuring systems</dc:subject><dc:subject xml:lang="sl">merilni sistemi</dc:subject><dc:subject xml:lang="en">reliability</dc:subject><dc:subject xml:lang="sl">zanesljivost</dc:subject><dcterms:temporal rdf:resource="1985-2025" /><dc:title xml:lang="sl">Zanesljivost merilnih sistemov|</dc:title><dc:description xml:lang="sl">The paper draws attention to the problems of reliability with special emphasis on measuring systems. Presented is a method for determining the reliability of hardware and some ways of improving it. Included is a list of relevant references</dc:description><dc:description xml:lang="sl">Članek opozarja na problematiko zanesljivosti s posebnim poudarkom na merilnih sistemih. Nakazan je postopek za določanje zanesljivosti aparaturne opreme in nekaj načinov za njeno povečanje. Navedena je literatura, ki omogoča temeljitejšo in poglobljeno obravnavo</dc:description><edm:type>TEXT</edm:type><dc:type xml:lang="sl">znanstveno časopisje</dc:type><dc:type xml:lang="en">journals</dc:type><dc:type rdf:resource="http://www.wikidata.org/entity/Q361785" /></edm:ProvidedCHO><ore:Aggregation rdf:about="http://www.dlib.si/?URN=URN:NBN:SI:DOC-AF8XFN7W"><edm:aggregatedCHO rdf:resource="URN:NBN:SI:DOC-AF8XFN7W" /><edm:isShownBy rdf:resource="http://www.dlib.si/stream/URN:NBN:SI:DOC-AF8XFN7W/0beb852f-03eb-458a-8b67-bc575ab91a69/PDF" /><edm:rights rdf:resource="http://rightsstatements.org/vocab/InC/1.0/" /><edm:provider>Slovenian National E-content Aggregator</edm:provider><edm:intermediateProvider xml:lang="en">National and University Library of Slovenia</edm:intermediateProvider><edm:dataProvider xml:lang="sl">Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</edm:dataProvider><edm:object rdf:resource="http://www.dlib.si/streamdb/URN:NBN:SI:DOC-AF8XFN7W/maxi/edm" /><edm:isShownAt rdf:resource="http://www.dlib.si/details/URN:NBN:SI:DOC-AF8XFN7W" /></ore:Aggregation></rdf:RDF>