<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-AF8XFN7W</identifier><date>1992</date><relation>documents/doc/A/URN_NBN_SI_doc-AF8XFN7W_001.pdf</relation><relation>documents/doc/A/URN_NBN_SI_doc-AF8XFN7W_001.txt</relation><format format_type="extent">22 (1992), 2 ; str. 107-111</format><format format_type="type">article</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID_HOST">3971844</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-AF8XFN7W</identifier><language>slv</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="eng">electrical measurements</subject><subject language_type_id="slv">električne meritve</subject><subject language_type_id="eng">measuring systems</subject><subject language_type_id="slv">merilni sistemi</subject><subject language_type_id="eng">reliability</subject><subject language_type_id="slv">zanesljivost</subject><title>Zanesljivost merilnih sistemov</title></Record>