<?xml version="1.0"?><rdf:RDF xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:edm="http://www.europeana.eu/schemas/edm/" xmlns:wgs84_pos="http://www.w3.org/2003/01/geo/wgs84_pos" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:rdaGr2="http://rdvocab.info/ElementsGr2" xmlns:oai="http://www.openarchives.org/OAI/2.0/" xmlns:owl="http://www.w3.org/2002/07/owl#" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:ore="http://www.openarchives.org/ore/terms/" xmlns:skos="http://www.w3.org/2004/02/skos/core#" xmlns:dcterms="http://purl.org/dc/terms/"><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-9E6CXGXU/cde35bb5-18b5-42e3-ada0-d99e9685f681/PDF"><dcterms:extent>1000 KB</dcterms:extent></edm:WebResource><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-9E6CXGXU/eec78ada-5359-4fd8-b222-66110cbe9e53/TEXT"><dcterms:extent>10 KB</dcterms:extent></edm:WebResource><edm:TimeSpan rdf:about="1985-2025"><edm:begin xml:lang="en">1985</edm:begin><edm:end xml:lang="en">2025</edm:end></edm:TimeSpan><edm:ProvidedCHO rdf:about="URN:NBN:SI:DOC-9E6CXGXU"><dcterms:isPartOf rdf:resource="https://www.dlib.si/details/URN:NBN:SI:spr-Z2J12Z6C" /><dcterms:issued>1994</dcterms:issued><dc:creator>Bizjak, M.</dc:creator><dc:creator>Koller, Lidija</dc:creator><dc:creator>Spruk, Sonja</dc:creator><dc:format xml:lang="sl">številka:1</dc:format><dc:format xml:lang="sl">letnik:24</dc:format><dc:format xml:lang="sl">str. 38-42</dc:format><dc:identifier>ISSN:0352-9045</dc:identifier><dc:identifier>COBISSID:17047301</dc:identifier><dc:identifier>URN:URN:NBN:SI:doc-9E6CXGXU</dc:identifier><dc:language>en</dc:language><dc:publisher xml:lang="sl">Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</dc:publisher><dcterms:isPartOf xml:lang="sl">Informacije MIDEM</dcterms:isPartOf><dc:subject xml:lang="en">Electronika</dc:subject><dc:subject xml:lang="sl">elektronika</dc:subject><dc:subject xml:lang="sl">kontaktna upornost</dc:subject><dc:subject xml:lang="sl">lastnosti</dc:subject><dc:subject xml:lang="sl">materiali</dc:subject><dc:subject xml:lang="sl">releji</dc:subject><dc:subject xml:lang="sl">sestavni deli</dc:subject><dcterms:temporal rdf:resource="1985-2025" /><dc:title xml:lang="sl">Characterisation of outgassing contact materials for miniature relays|</dc:title><dc:description xml:lang="sl">Systematic investigations of vacuum outgassing for hermetic relays with AgCdO/AGPHOR and PdAg3O Au electroplated contacts were done. The experimental vacuum system constructed and built at our institute was additionally equiped with quadrupole mass spectrometer for residual gas analysis. Prior to the final encapsulation the relays were baked at the constant temperature of 125°C and outgassed in vacuum 1X10sup-5 mbar for several hours. The residual atmosphere was analysed every hour; in residual gas mixture, hydrogen, carbon monoxide, carbon dioxide, water vapour and remanents of cleaning chemical agents (ethanol, trichlorethylene) and hydrocarbons were found. Residual gas analysis showed that the concentration of impurity gases depends on materials and their treatments in different technological phases</dc:description><dc:description xml:lang="sl">Sistematično smo raziskovali hermetične releje z AgCdO (AGPHOR lot folija) in PdAg30 elektrokemijsko pozlačenimi kontakti. Eksperimentalni vakuumski sistem, ki smo ga uporabljali, je bil konstruiran in narejen na našem inštitutu. Dodatno smo ga opremili s kvadrupolnim masnim spektrometrom za analizo preostale atmosfere v relejih. Pred dokončno inkapsulacijo smo preiskovane releje razplinjevali nekaj ur pri konstantni temperaturi 125°C v vakuumu 1X10zgoraj-5 mbar. Vsako uro smo analizirali atmosfero v relejih. V izmerjeni mečanici plinov smo odkrili vodik, ogljikov monoksid, ogljikov dioksid, vodno paro, ostanke kemijskih čistil (etanola in trikloretilena) in klorovodike. Analiza je pokazala, da je koncentracija plinskih nečistoč odvisna od materialov samih, pa tudi od njihove obdelave v različnih tehnoloških postopkih</dc:description><edm:type>TEXT</edm:type><dc:type xml:lang="sl">znanstveno časopisje</dc:type><dc:type xml:lang="en">journals</dc:type><dc:type rdf:resource="http://www.wikidata.org/entity/Q361785" /></edm:ProvidedCHO><ore:Aggregation rdf:about="http://www.dlib.si/?URN=URN:NBN:SI:DOC-9E6CXGXU"><edm:aggregatedCHO rdf:resource="URN:NBN:SI:DOC-9E6CXGXU" /><edm:isShownBy rdf:resource="http://www.dlib.si/stream/URN:NBN:SI:DOC-9E6CXGXU/cde35bb5-18b5-42e3-ada0-d99e9685f681/PDF" /><edm:rights rdf:resource="http://rightsstatements.org/vocab/InC/1.0/" /><edm:provider>Slovenian National E-content Aggregator</edm:provider><edm:intermediateProvider xml:lang="en">National and University Library of Slovenia</edm:intermediateProvider><edm:dataProvider xml:lang="sl">Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</edm:dataProvider><edm:object rdf:resource="http://www.dlib.si/streamdb/URN:NBN:SI:DOC-9E6CXGXU/maxi/edm" /><edm:isShownAt rdf:resource="http://www.dlib.si/details/URN:NBN:SI:DOC-9E6CXGXU" /></ore:Aggregation></rdf:RDF>