Surface defect detection on optical devices based on microscopic dark-field scattering imaging

URN:NBN:SI:DOC-6PBYX1682015Bai, MingranTao, XianWang, XingangXu, DeYingjie, YinZhang, FengZhang, Zhengtaodocuments/doc/6/URN_NBN_SI_doc-6PBYX168_001.pdfdocuments/doc/6/URN_NBN_SI_doc-6PBYX168_001.txt161articlestr. 24-32, SI 60039-248013857307URN:NBN:SI:doc-6PBYX168engZveza strojnih inženirjev in tehnikov Slovenije et al.Strojniški vestnikInCalgoritem grozdovLDFoptične napravesegmentacija posnetkaSIFTsnemanje v temnem poljuzlaganje posnetkovSurface defect detection on optical devices based on microscopic dark-field scattering imaging