<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-4IJMMGMQ</identifier><date>2021</date><creator>Bavdek, Gregor</creator><relation>documents/doc/4/URN_NBN_SI_doc-4IJMMGMQ_001.pdf</relation><relation>documents/doc/4/URN_NBN_SI_doc-4IJMMGMQ_001.txt</relation><format format_type="issue">5</format><format format_type="volume">55</format><format format_type="type">article</format><format format_type="extent">str. 637-648</format><identifier identifier_type="DOI">10.17222/mit.2021.142</identifier><identifier identifier_type="ISSN">1580-2949</identifier><identifier identifier_type="COBISSID">80511235</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-4IJMMGMQ</identifier><language>eng</language><publisher publisher_location="Ljubljana">Inštitut za kovinske materiale in tehnologije</publisher><source>Materiali in tehnologije</source><rights>InC</rights><subject language_type_id="slv">absorpcija rentgenskih žarkov</subject><subject language_type_id="eng">electronic structure</subject><subject language_type_id="slv">elektronska struktura</subject><subject language_type_id="eng">molecular orbitals</subject><subject language_type_id="slv">molekulske orbitale</subject><subject language_type_id="eng">NEXAFS</subject><subject language_type_id="slv">tanki filmi</subject><subject language_type_id="eng">thin films</subject><subject language_type_id="eng">X-ray absorption</subject><title>NEXAFS - a modern technique for studying the molecular orbitals in thin layers</title><title>NEXAFS - sodobna tehnika za študij molekulskih orbital v tankih plasteh</title></Record>