<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-31JOGR8J</identifier><date>2002</date><creator>Jernot, Jean-Paul</creator><creator>Jouannot-Chesney, Patricia</creator><creator>Lantuéjoul, Christian</creator><creator>Nouet, Gérard</creator><creator>Ruterana, Pierre</creator><relation>documents/znanstveni_clanki/image_analysis_and_stereology/html/urn_nbn_si_doc-31jogr8j.html</relation><relation>documents/znanstveni_clanki/image_analysis_and_stereology/pdf/urn_nbn_si_doc-31jogr8j.pdf</relation><relation>documents/znanstveni_clanki/image_analysis_and_stereology/txt/urn_nbn_si_doc-31jogr8j.txt</relation><format format_type="volume">21</format><format format_type="issue">3</format><format format_type="main">8 strani</format><format format_type="type">article</format><format format_type="extent">str. 191-198</format><identifier identifier_type="ISSN">1580-3139</identifier><identifier identifier_type="COBISSID">16034009</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-31JOGR8J</identifier><language>eng</language><publisher>Društvo za stereologijo in kvantitativno analizo slike, Medicinska fakulteta</publisher><source>Image analysis and stereology</source><rights>InC</rights><subject language_type_id="eng">Crystallography</subject><subject language_type_id="slv">defekti</subject><subject language_type_id="slv">Delec, velikost</subject><subject language_type_id="eng">Image Processing, Computer-Assisted</subject><subject language_type_id="slv">kristalna struktura</subject><subject language_type_id="slv">Kristalografija</subject><subject language_type_id="eng">Particle Size</subject><subject language_type_id="slv">Slika, obdelava z računalnikom</subject><subject language_type_id="slv">topologija</subject><title>Topological localisation of defects at atomic scale</title></Record>