<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-2ZL1Z2K2</identifier><date>2009</date><creator>Karim, Abid</creator><relation>documents/doc/2/URN_NBN_SI_doc-2ZL1Z2K2_001.pdf</relation><relation>documents/doc/2/URN_NBN_SI_doc-2ZL1Z2K2_001.txt</relation><format format_type="issue">3</format><format format_type="volume">39</format><format format_type="type">article</format><format format_type="extent">str. 132-134</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">7578452</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-2ZL1Z2K2</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">fotodetekcija</subject><subject language_type_id="slv">fotodetektorji</subject><subject language_type_id="slv">fotodioda</subject><title>Effect of absorption layer thickness on internal quantum efficiency of zero-bias waveguide photodetectors</title><title>Vpliv debeline absorpcijske plasti na kvantno učinkovitost fotodetektorja z valovodom</title></Record>