<?xml version="1.0"?><rdf:RDF xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:edm="http://www.europeana.eu/schemas/edm/" xmlns:wgs84_pos="http://www.w3.org/2003/01/geo/wgs84_pos" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:rdaGr2="http://rdvocab.info/ElementsGr2" xmlns:oai="http://www.openarchives.org/OAI/2.0/" xmlns:owl="http://www.w3.org/2002/07/owl#" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:ore="http://www.openarchives.org/ore/terms/" xmlns:skos="http://www.w3.org/2004/02/skos/core#" xmlns:dcterms="http://purl.org/dc/terms/"><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-2GQWYOYX/890fc47a-03ff-4035-8a3a-3a4bf21e13a8/HTML"><dcterms:extent>19 KB</dcterms:extent></edm:WebResource><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-2GQWYOYX/aedf7204-376b-459e-bc1b-ff0df42db232/PDF"><dcterms:extent>675 KB</dcterms:extent></edm:WebResource><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-2GQWYOYX/33f7f5ad-797c-4ae8-ac09-d8a663d82d76/TEXT"><dcterms:extent>16 KB</dcterms:extent></edm:WebResource><edm:TimeSpan rdf:about="2000-2024"><edm:begin xml:lang="en">2000</edm:begin><edm:end xml:lang="en">2024</edm:end></edm:TimeSpan><edm:ProvidedCHO rdf:about="URN:NBN:SI:DOC-2GQWYOYX"><dcterms:isPartOf rdf:resource="https://www.dlib.si/details/urn:nbn:si:spr-ihg6vo21" /><dcterms:issued>2011</dcterms:issued><dc:creator>Mandrino, Djordje</dc:creator><dc:format xml:lang="sl">številka:4</dc:format><dc:format xml:lang="sl">letnik:45</dc:format><dc:format xml:lang="sl">str. 325-328</dc:format><dc:identifier>ISSN:1580-2949</dc:identifier><dc:identifier>COBISSID:865962</dc:identifier><dc:identifier>URN:URN:NBN:SI:doc-2GQWYOYX</dc:identifier><dc:language>en</dc:language><dc:publisher xml:lang="sl">Inštitut za kovinske materiale in tehnologije</dc:publisher><dcterms:isPartOf xml:lang="sl">Materiali in tehnologije</dcterms:isPartOf><dc:subject xml:lang="sl">elektronska mikroskopija</dc:subject><dc:subject xml:lang="sl">jedkanje</dc:subject><dc:subject xml:lang="sl">površine</dc:subject><dc:subject xml:lang="sl">reaktivnost</dc:subject><dc:subject xml:lang="sl">rentgenska fotoelektronska spektroskopija</dc:subject><dc:subject xml:lang="sl">železov sulfid</dc:subject><dc:subject rdf:resource="http://www.wikidata.org/entity/Q6073081" /><dcterms:temporal rdf:resource="2000-2024" /><dc:title xml:lang="sl">XPS and SEM of unpolished and polished FeS surface| Rentgenska fotoelektronska spektroskopija in vrstična elektronska mikroskopija nepolirane in polirane površine FeS|</dc:title><dc:description xml:lang="sl">It was attempted to measure parameters of Fe 2p and S 2p transitions for Fe and S in FeS to compare them with range of values obtainable from the literature FeS specimen was manufactured from the standard material used for chemical analysis. X-ray Photoelectron spectroscopy (XPS) was first performed on non-polished and then on polished surface. Scanning Electron Microscopy (SEM) was used to image both surfaces. It was found that major constituents of non-polished surface are sulphate and sulphite compounds but that composition and structure of the polished surface are also complex and may become increasingly so after cleaning by ion sputtering. At best, composition of the surface approximated FeS very poorly, thus necessitating the use of literature Fe 2p and S 2p parameter values instead of directly measuring improved values</dc:description><dc:description xml:lang="sl">Poskusili smo izmeriti parametre prehodov Fe 2p za Fe in S v FeS, da bi jih primerjali s širokim razponom vrednosti iz literature. Vzorec FeS za meritve smo izdelali iz standardne kemikalije, ki se uporablja v kemijski analitiki. Z rentgensko fotoelektronsko spektroskopijo smo najprej opravili meritve na nepolirani in potem še na polirani površini vzorca. Z vrstično elektronsko mikroskopijo smo upodobili obe površini. Ugotovili smo, da nepolirano površino v pomembnem delu sestavljajo sulfati in sulfiti, da pa sta tudi sestava in struktura polirane površine kompleksni in da to kompleksnost čiščenje površine z ionskim jedkanjem lahko še poveča. V najboljšem primeru je sestava površine zelo slab približek za FeS, in je bolje še naprej uporabljati literaturne vrednosti za ustrezne parametre za Fe 2p in S 2p namesto direktno izmerjenih na obravnavanem vzorcu</dc:description><edm:type>TEXT</edm:type><dc:type xml:lang="sl">znanstveno časopisje</dc:type><dc:type xml:lang="en">journals</dc:type><dc:type rdf:resource="http://www.wikidata.org/entity/Q361785" /></edm:ProvidedCHO><ore:Aggregation rdf:about="http://www.dlib.si/?URN=URN:NBN:SI:DOC-2GQWYOYX"><edm:aggregatedCHO rdf:resource="URN:NBN:SI:DOC-2GQWYOYX" /><edm:isShownBy rdf:resource="http://www.dlib.si/stream/URN:NBN:SI:DOC-2GQWYOYX/aedf7204-376b-459e-bc1b-ff0df42db232/PDF" /><edm:rights rdf:resource="http://rightsstatements.org/vocab/InC/1.0/" /><edm:provider>Slovenian National E-content Aggregator</edm:provider><edm:intermediateProvider xml:lang="en">National and University Library of Slovenia</edm:intermediateProvider><edm:dataProvider xml:lang="sl">Inštitut za kovinske materiale in tehnologije</edm:dataProvider><edm:object rdf:resource="http://www.dlib.si/streamdb/URN:NBN:SI:DOC-2GQWYOYX/maxi/edm" /><edm:isShownAt rdf:resource="http://www.dlib.si/details/URN:NBN:SI:DOC-2GQWYOYX" /></ore:Aggregation></rdf:RDF>