<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-1D306VNI</identifier><date>2015</date><creator>Milovanović, Marko</creator><relation>documents/doc/1/URN_NBN_SI_doc-1D306VNI_001.pdf</relation><relation>documents/doc/1/URN_NBN_SI_doc-1D306VNI_001.txt</relation><relation>https://repozitorij.uni-lj.si/IzpisGradiva.php?id=83819</relation><format format_type="extent">266 str., 31 cm</format><format format_type="type">doktorska dela</format><identifier identifier_type="COBISSID">11400788</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-1D306VNI</identifier><language>eng</language><publisher publisher_location="Ljubljana">M. Milovanović</publisher><source>visokošolska dela</source><rights>InC</rights><subject language_type_id="slv">detektor za modeliranje in simulacije</subject><subject language_type_id="slv">Disertacije</subject><subject language_type_id="slv">polprevodniški detektorji</subject><subject language_type_id="slv">radiacijske poškodbe</subject><subject language_type_id="slv">sevanja hard detektorja</subject><subject language_type_id="slv">Si mikro strip in pad detektorji</subject><subject language_type_id="slv">Silicijevi detektorji</subject><title>doctoral thesis</title><title>Electric field and charge multiplication in radiation-damaged silicon detectors</title></Record>